Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.
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Black developed an empirical model to estimate the MTTF of a wire, taking electromigration into consideration, which is now beolcore known as the Black model.
Be,lcore empirical or standards based methods can be used in the design stage to quickly obtain a rough estimation of product reliability. In physics of failure approaches, the model parameters can be determined from design specs or from test data.
Bellcore/Telcordia Reliability Prediction in Lambda Predict
Therefore, in order to consider the complexity of the entire system, life tests can be conducted at the system level, treating the system as a “black box,” and the system reliability can be predicted based on the obtained failure data. Screen shots click to enlarge. Method II is based on combining Method I predictions with data from laboratory tests performed in accordance with specific SR criteria.
Numerous experiments with different stress conditions have been reported in the literature, where the values have been reported in the range between 2 and 3. Among these approaches, three main categories are often used within government and industry: Three factors are usually considered for testing: Finally, we will discuss life testing methods, which are used to determine reliability by testing a relatively large number of samples at their specified operation stresses or higher stresses and using statistical models to analyze the data.
To obtain high product reliability, consideration of reliability issues should be integrated from the very beginning of the design phase.
Features Powerful and user friendly Telcordia telecom standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeed goals Select components with regard bellocre reliability and cost savings Be more accurate and efficient than with manual methods Take advantage of powerful ‘what if’ analytical tools Identify weakareas in a system design Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities.
Accurate prediction of the reliability of electronic products belldore knowledge of the components, the design, the manufacturing process and the expected operating conditions. Historically, this term has been used to denote the process of applying mathematical models and component data for the purpose of estimating the field reliability of a system before failure data rr-332 available for the system.
The standard provides the generic failure rates and three part stress factors: Time plot and calculated B10 life. It can also be used directly by telecommunications service providers for product reliability evaluation. Electromigration is a failure mechanism that results from the transfer of momentum from the electrons, which move in the applied electric field, to the ions, which make up the lattice of the interconnect material.
Fatigue failures can occur in electronic devices due to temperature cycling and thermal shock.
Contact us now for a price list, free trial or quotation: Since it is a chemical process, the aging of a capacitor such as an electrolytic capacitor is accelerated by increasing the operating temperature. The tf-332 testing method may also be preferred over both the empirical and physics of failure methods when it is necessary to obtain realistic predictions at the system rather than component level.
The failure rate is 9. The Telcordia standard also documents a recommended method for predicting serial system hardware reliability. According to the handbook, the failure rate of a commercial ceramic capacitor of 0.
The model takes the following form. Next, we will discuss physics of failure methods, which are based on root-cause analysis of failure mechanisms, failure modes and stresses. To download a free demonstration of our Telcordia software click here.
For example, for the Weibull distribution, the life characteristic is the scale parameter eta and for the lognormal distribution, it is the log mean. Empirical or Standards Based Prediction Methods Empirical prediction methods are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers. These techniques estimate the mean failure rate in FITs for electronic equipment. As mentioned above, time-to-failure data from life testing may be incorporated into some of the empirical prediction standards i.
Click to Request Price Quote. Some have gained popularity beellcore industry in the past three decades. With this method, a test is conducted on a sufficiently large sample of units operating under normal usage conditions. Powerful and user friendly Telcordia telecom standard reliability prediction software.
However, in this section of the article, we are using the term life testing method to refer specifically to a third type of approach for predicting the reliability of electronic products. The parts count method assumes typical operating conditions of part complexity, ambient temperature, various electrical stresses, operation mode and environment called reference conditions.
There are many different empirical methods that have been created for specific applications. The most common failure mode is “conductor open. This procedure also documents a recommended method for predicting serial system hardware reliability.
Reliability and Maintainability Symp. In using the above models, the model parameters can be determined from the design specifications or operating conditions. Download Demo Web Demo Spec Sheet Training Screen shots click to enlarge Grid view Dialog view Chart view Features Powerful and user friendly Telcordia telecom standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeed goals Select components with regard to reliability and cost savings Be more accurate and efficient than with manual methods Take advantage of powerful ‘what if’ analytical tools Identify weakareas in a system design Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities.
Although empirical prediction standards have been used for many years, it is always wise to use them with caution.
Telcordia TR and SR Reliability Prediction Software from ITEM Software
Some parameters in the curve function can be modified by integrating engineering knowledge. Issue 4 of SR provides all the tools needed for predicting device and unit hardware reliability, and contains important revisions since the document was last issued. An extended range of complexity for devices, and the addition of new devices. Hot carrier injection describes the phenomena observed in MOSFETs by which the carrier gains sufficient energy to be injected into the gate oxide, generate interface or bulk oxide defects and degrade MOSFETs characteristics such as threshold voltage, transconductance, etc.
On the other hand, with the life testing method, since the failure data from your own particular products are obtained, the prediction results usually are more accurate than those from a general standard or model.